Short for atomic force microscopy. The AFM tip scans the sample line for line. Due to repulsion between needle and sample a movement of the tip is detected. A three dimensional image can be simulated.
Synonyms:
atomic force microscopy
Short for atomic force microscopy. The AFM tip scans the sample line for line. Due to repulsion between needle and sample a movement of the tip is detected. A three dimensional image can be simulated.